Thin Film
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Description
Specifications
- Suitable for most laboratory based x-ray diffractometers and synchrotron sources.
- For example*: Bruker D8, Rigaku SmartLab, PanAnalytical Empyrean and X'Pert.
- Depending on feature size of interest, x-ray beam focusing options may be required.
- Polarization, I-V and C-V curve measurements in situ.
- Applied voltages ±50V.
- Sample diameters up to 15 mm with probe tip positioning over full area.
- Sample/substrate thicknesses up to 3 mm.
- Temperature range from room temperature to 300°C.
- Large scattering angle range, including grazing incidence angles for GIXRD or reflectivity measurements.
- Compact system design for maximum portability and versatility.
Please Note
Related Products
Working with high-energy x-rays offers some advantages in the study of bulk electro-mechanical materials. The Transmission Geometry system is ideally suited for use at high-energy synchrotron x-ray beamlines or lab sources with higher energy targets such as Ag or Mo. Precise polarization and strain measurements can be obtained in-situ at voltages up to ±7.5 kV.
The Reflection Geometry system allows electric fields of ±5kV to be applied to bulk materials while conducting XRD measurements from a surface. Ideal for electro-ceramic and single crystal research in laboratory or synchrotron x-ray systems. Electrical current and displacements sensors are packaged within the unit allowing simultaneous strain and polarization measurements.
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Demonstration
Related Products
Working with high-energy x-rays offers some advantages in the study of bulk electro-mechanical materials. The Transmission Geometry system is ideally suited for use at high-energy synchrotron x-ray beamlines or lab sources with higher energy targets such as Ag or Mo. Precise polarization and strain measurements can be obtained in-situ at voltages up to ±7.5 kV.
The Reflection Geometry system allows electric fields of ±5kV to be applied to bulk materials while conducting XRD measurements from a surface. Ideal for electro-ceramic and single crystal research in laboratory or synchrotron x-ray systems. Electrical current and displacements sensors are packaged within the unit allowing simultaneous strain and polarization measurements.